- Tip geometries: Berkovich, 1, 16, 100 mm radius conical-spherical diamond
Mesoscale Material Characterization Lab (MMCL)
The Materials Informatics for Engineering Design (MINED) Research Group headed by Professor Surya Kalidindi has specialized facilities for characterizing the microstructure and localized mechanical behavior of crystalline metals and alloys as well as other novel hybrid materials.
Major Equipment
Tescan Mira3 XM FEG-SEM with EBSD and in-situ nanoindenter
This high resolution field emission scanning electron microscope (SEM) includes EDAX/AMETEK Electron Backscatter Detector and TSL OIM analysis software to obtain crystallographic orientation information. In addition, in-situ studies of nanoindentation can be conducted with a Nanomechanics InSEM nanoindenter with CSM capability. Some key specifications include
- SEM resolution @ 30 kV SE – 1.2 nm
- SEM resolution @ 3 kV SE – 2.5 nm
- SEM resolution @ 30 kV BSE – 2.0 nm
- Orientation resolution – 0.1 degree
- In-situ nanoindenter displacement resolution – 0.1 nm
- In-situ nanoindenter load resolution – 200 nN
- In-situ nanoindenter max load – 50 mN
Agilent G200 Nano Indenter with CSM
The Nano Indenter G200 enables users to measure Young's modulus and hardness in compliance with ISO 14577. The electromagnetic actuation allows unparalleled dynamic range in force and displacement control. Deformations can be measured over six orders of magnitude (from nanometers to millimeters). The system includes the option for continuous stiffness measurement (CSM) for dynamic properties characterization and for generation of indentation stress-strain curves. Some key specifications include
- Displacement resolution – 0.01 nm
- Load resolution – 1.0 mN
- Max load – 10 N
- Tip geometries: Berkovich, 1, 16, 100 mm radius conical-spherical diamond
Zwick ZHU/Z2.5 Instrumented Hardness Test Machine
Programmable and fully automated indentation modes allowing testing along preselected grid or at preferred sites on the sample.
- Max load – 2.5 kN
- Tip geometries: Vickers, several spherical from 1 - 10 mm radius
Hitachi IM4000-Plus Cryo Ion Polisher
An ion mill for surface prep of samples with low heat generation operating at two modes: flat polishing and cross sectioning
- Milling rate: 500 500um/hr@6kV